SMART-FTO SYSTEM MODEL BASED ON ISHIKAWA DIAGRAM IN NEEDS MAPPING ANALYSIS FOR BUILDING BRAND QUALITY OF HIGHER EDUCATION INSTITUTIONS

Authors

  • Rochmawati Universitas Negeri Malang
  • Ibrahim Bafadhal
  • Evi Eliyanah
  • Hasna Dwi Purbaningrum
  • Moch. Haris Purwanto Faculty of Education, Universitas Negeri Malang, Malang, Indonesia
  • Amelia Dwi Lestari Faculty of Education, Universitas Negeri Malang, Malang, Indonesia
  • Agustinus Agustinus National University of Laos, Vientiane, Laos
  • Kongsy Counlamany National University of Laos, Vientiane, Laos

Keywords:

Brand Quality, Smart-FTO System, Ishikawa Diagram

Abstract

In an effort to improve brand quality, the National University of Laos (NUOL) implemented the Smart-Figuring Things Out (FTO) System Model based on the Ishikawa Diagram. This article discusses the application of the model in analyzing organizational needs mapping and identifying factors that influence the brand quality of higher education institutions. The analysis reveals several key factors, including academic quality, facilities, services, and community engagement. These factors are associated with eight dimensions of brand quality: performance, features, reliability, conformance, durability, serviceability, aesthetics, and perceived quality. By identifying and addressing these factors, NUOL can develop comprehensive strategies to enhance its reputation and competitiveness. The application of this model shows an increase in public perception of NUOL, a rise in the number of applicants, and improvements in academic rankings, which can serve as a reference for other universities in similar efforts.

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Published

2024-09-09

How to Cite

Rochmawati, Bafadhal, I., Eliyanah, E., Purbaningrum, H. D., Haris Purwanto, M., Dwi Lestari, A., … Counlamany, K. (2024). SMART-FTO SYSTEM MODEL BASED ON ISHIKAWA DIAGRAM IN NEEDS MAPPING ANALYSIS FOR BUILDING BRAND QUALITY OF HIGHER EDUCATION INSTITUTIONS. Proceeding of International Conference on Multidisciplinary Research, 2(1), 62–76. Retrieved from https://proceedingkptcn.com/index.php/icmr/article/view/51